Risk factors analysis of semiconductor components based on CART
Bing Ma; Lihua Chen; Wenbo Zhang; Aihua Li
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Procedia Computer Science
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.procs.2024.08.163
The original publisher provides the full text and its access options.
Cite this source
Bing Ma; Lihua Chen; Wenbo Zhang; Aihua Li. Risk factors analysis of semiconductor components based on CART. Procedia Computer Science. 2024. https://doi.org/10.1016/j.procs.2024.08.163