Pushing the Thickness Limit of the Giant Rashba Effect in Ferroelectric Semiconductor GeTe
Boris Croes; Alexandre Llopez; Calvin Tagne-Kaegom; Bodry Tegomo-Chiogo; Bertrand Kierren; Pierre Müller; Stefano Curiotto; Patrick Le Fèvre; François Bertran; Andrés Saúl; Yannick Fagot-Revurat; Frédéric Leroy; Fabien Cheynis
- Published
- Publisher
- American Chemical Society (ACS)
- Journal / collection
- Nano Letters
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1021/acs.nanolett.4c03281
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Cite this source
Boris Croes; Alexandre Llopez; Calvin Tagne-Kaegom; Bodry Tegomo-Chiogo; Bertrand Kierren; Pierre Müller; Stefano Curiotto; Patrick Le Fèvre; François Bertran; Andrés Saúl; Yannick Fagot-Revurat; Frédéric Leroy; Fabien Cheynis. Pushing the Thickness Limit of the Giant Rashba Effect in Ferroelectric Semiconductor GeTe. Nano Letters. 2024-10-14. https://doi.org/10.1021/acs.nanolett.4c03281