Mapping of Semiconductor Electrical Properties with Terahertz Time-Domain Ellipsometry
Verdad C. Agulto; Toshiyuki Iwamoto; Zixi Zhao; Shuang Liu; Kosaku Kato; Makoto Nakajima
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 49th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/irmmw-thz60956.2024.10697746
The original publisher provides the full text and its access options.
Cite this source
Verdad C. Agulto; Toshiyuki Iwamoto; Zixi Zhao; Shuang Liu; Kosaku Kato; Makoto Nakajima. Mapping of Semiconductor Electrical Properties with Terahertz Time-Domain Ellipsometry. 2024 49th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz). 2024-09-01. https://doi.org/10.1109/irmmw-thz60956.2024.10697746