Deep Learning in Semiconductor Devices for Road Damage Inspection Applications
Vijay Kumar Kodavalla
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 International Conference on Distributed Systems, Computer Networks and Cybersecurity (ICDSCNC)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1109/icdscnc62492.2024.10939564
The original publisher provides the full text and its access options.
Cite this source
Vijay Kumar Kodavalla. Deep Learning in Semiconductor Devices for Road Damage Inspection Applications. 2024 International Conference on Distributed Systems, Computer Networks and Cybersecurity (ICDSCNC). 2024-09-20. https://doi.org/10.1109/icdscnc62492.2024.10939564