Exploring Quantum Convolutional Neural Network for Fault Detection in Semiconductor Wafers
Debajyoti Biswas; Shikha Marwaha; Sriya Atmakuru
- Published
- Publisher
- Center for Open Science
- Research area
- AI & compute
- Source type
- Preprint / posted paper
- DOI
- 10.31219/osf.io/gzjfy_v1
This is a preprint or other posted paper. Check the original source for its review and publication status.
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Cite this source
Debajyoti Biswas; Shikha Marwaha; Sriya Atmakuru. Exploring Quantum Convolutional Neural Network for Fault Detection in Semiconductor Wafers. Center for Open Science. 2025-02-12. https://doi.org/10.31219/osf.io/gzjfy_v1