Bayesian Network Modeling of Transistor-Level Total Ionizing Dose Effects Impact on Circuit Electrical Response in Space Environment
Zhaofeng Zhen; Tao Ying; Yang Song; Yubao Zhang; Weiqi Li; Xiuhai Cui; Jianqun Yang; Shangli Dong; Xingji Li
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Nuclear Science
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tns.2023.3333415
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Cite this source
Zhaofeng Zhen; Tao Ying; Yang Song; Yubao Zhang; Weiqi Li; Xiuhai Cui; Jianqun Yang; Shangli Dong; Xingji Li. Bayesian Network Modeling of Transistor-Level Total Ionizing Dose Effects Impact on Circuit Electrical Response in Space Environment. IEEE Transactions on Nuclear Science. 2024-05. https://doi.org/10.1109/tns.2023.3333415