LLM-Assisted Analytics in Semiconductor Test (Invited)
Li-C. Wang
- Published
- Publisher
- ACM
- Journal / collection
- Proceedings of the 2024 ACM/IEEE International Symposium on Machine Learning for CAD
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1145/3670474.3685974
The original publisher provides the full text and its access options.
Cite this source
Li-C. Wang. LLM-Assisted Analytics in Semiconductor Test (Invited). Proceedings of the 2024 ACM/IEEE International Symposium on Machine Learning for CAD. 2024-09-09. https://doi.org/10.1145/3670474.3685974