Quantitative Analysis of Defect Detection Algorithm for Semiconductor Package Redistribution Layer Using Acoustic Microscope
Min-Seok Kim; Hyeong-Geun Jo; Dong-Young Kim; Min-Chul Kim; Hyun-Su Kim; Kwan-Kyu Park
- Published
- Publisher
- The Korean Society of Nondestructive Testing
- Journal / collection
- JOURNAL OF THE KOREAN SOCIETY FOR NONDESTRUCTIVE TESTING
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.7779/jksnt.2024.44.4.231
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Cite this source
Min-Seok Kim; Hyeong-Geun Jo; Dong-Young Kim; Min-Chul Kim; Hyun-Su Kim; Kwan-Kyu Park. Quantitative Analysis of Defect Detection Algorithm for Semiconductor Package Redistribution Layer Using Acoustic Microscope. JOURNAL OF THE KOREAN SOCIETY FOR NONDESTRUCTIVE TESTING. 2024-08-31. https://doi.org/10.7779/jksnt.2024.44.4.231