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Research literature / Conference paper

A Hybrid DCNN ECOC-SVM System for Detecting Semiconductor Wafer Defects Using Histogram Equalization

Sharith Dhar; Md. Saiful Islam

Published
Publisher
IEEE
Journal / collection
2024 International Conference on Innovations in Science, Engineering and Technology (ICISET)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/iciset62123.2024.10941498

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Sharith Dhar; Md. Saiful Islam. A Hybrid DCNN ECOC-SVM System for Detecting Semiconductor Wafer Defects Using Histogram Equalization. 2024 International Conference on Innovations in Science, Engineering and Technology (ICISET). 2024-10-26. https://doi.org/10.1109/iciset62123.2024.10941498

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