Testing a Transistor-Level Programmable Fabric: Challenges and Solutions
Apurva Jain; Thomas Broadfoot; Carl Sechen; Yiorgos Makris
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE 42nd VLSI Test Symposium (VTS)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/vts60656.2024.10538901
The original publisher provides the full text and its access options.
Cite this source
Apurva Jain; Thomas Broadfoot; Carl Sechen; Yiorgos Makris. Testing a Transistor-Level Programmable Fabric: Challenges and Solutions. 2024 IEEE 42nd VLSI Test Symposium (VTS). 2024-04-22. https://doi.org/10.1109/vts60656.2024.10538901