Skip to content
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Journal article

Ultrawide Bandgap AlN Trench Metal-Oxide-Semiconductor Transistors (MOSFETs) on Single-Crystal AlN Substrates

Bingcheng Da; Dinusha Herath Mudiyanselage; Dawei Wang; Ziyi He; Junzhe Xie; Houqiang Fu

Published
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Journal / collection
IEEE Transactions on Materials for Electron Devices
Research area
Semiconductors
Source type
Journal article
DOI
10.1109/tmat.2025.3601062

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Bingcheng Da; Dinusha Herath Mudiyanselage; Dawei Wang; Ziyi He; Junzhe Xie; Houqiang Fu. Ultrawide Bandgap AlN Trench Metal-Oxide-Semiconductor Transistors (MOSFETs) on Single-Crystal AlN Substrates. IEEE Transactions on Materials for Electron Devices. 2025. https://doi.org/10.1109/tmat.2025.3601062

Download RIS