RRAM Mirrored and RRAM-Transistor Hybrid Single Device Logic Gates Based on Two-Dimensional Materials
Yang Shen; Jintian Gao; Zhanfeng Guo; Yanming Liu; He Tian
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Electron Device Letters
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/led.2023.3332095
The original publisher provides the full text and its access options.
Cite this source
Yang Shen; Jintian Gao; Zhanfeng Guo; Yanming Liu; He Tian. RRAM Mirrored and RRAM-Transistor Hybrid Single Device Logic Gates Based on Two-Dimensional Materials. IEEE Electron Device Letters. 2024-01. https://doi.org/10.1109/led.2023.3332095