Characterization of ion-sensitive field effect transistor by varying channel length for different gate oxide thickness
Suchismita Sen; Pinaki Chakraborty; Argha Sarkar
- Published
- Publisher
- AIP Publishing
- Journal / collection
- AIP Conference Proceedings
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1063/5.0205264
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Cite this source
Suchismita Sen; Pinaki Chakraborty; Argha Sarkar. Characterization of ion-sensitive field effect transistor by varying channel length for different gate oxide thickness. AIP Conference Proceedings. 2024. https://doi.org/10.1063/5.0205264