Reliability Analysis of Multibridge Channel Field Effect Transistor
Huang Ganlin; N. Ezaila Alias; M. L. Peng Tan; M. N. Hamzah; Yasmin Abdul Wahab; Hanim Hussin
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE International Conference on Semiconductor Electronics (ICSE)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/icse62991.2024.10681374
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Cite this source
Huang Ganlin; N. Ezaila Alias; M. L. Peng Tan; M. N. Hamzah; Yasmin Abdul Wahab; Hanim Hussin. Reliability Analysis of Multibridge Channel Field Effect Transistor. 2024 IEEE International Conference on Semiconductor Electronics (ICSE). 2024-08-19. https://doi.org/10.1109/icse62991.2024.10681374