Single-Event Burnout in Semiconductor Devices: Efficient Classification of Ion Species
Julia T. Santos; Reinaldo A. C. Bianchi; Marcilei A. Guazzelli; Juliano A. De Oliveira; Saulo G. Alberton; Renato C. Giacomini
- Published
- Publisher
- Journal of Integrated Circuits and Systems
- Journal / collection
- Journal of Integrated Circuits and Systems
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.29292/jics.v19i3.933
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Cite this source
Julia T. Santos; Reinaldo A. C. Bianchi; Marcilei A. Guazzelli; Juliano A. De Oliveira; Saulo G. Alberton; Renato C. Giacomini. Single-Event Burnout in Semiconductor Devices: Efficient Classification of Ion Species. Journal of Integrated Circuits and Systems. 2024-12-23. https://doi.org/10.29292/jics.v19i3.933