Strain modulation effects on two-dimensional tellurium for advanced p-type transistor applications
Jong-Sang Oh; Tae In Kim; Hyuck-In Kwon; Ick-Joon Park
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Applied Surface Science
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.apsusc.2024.159288
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Cite this source
Jong-Sang Oh; Tae In Kim; Hyuck-In Kwon; Ick-Joon Park. Strain modulation effects on two-dimensional tellurium for advanced p-type transistor applications. Applied Surface Science. 2024-04. https://doi.org/10.1016/j.apsusc.2024.159288