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Research literature / Conference paper

Artificial Intelligence-Driven Approaches for Automatic Wafer Map Failure Detection in Semiconductor Manufacturing

Hiranmaye Sarpana Chandu; Sumeet Mathur; Sandeep Gupta

Published
Publisher
IEEE
Journal / collection
2025 IEEE International Conference on Interdisciplinary Approaches in Technology and Management for Social Innovation (IATMSI)
Research area
AI & compute
Source type
Conference paper
DOI
10.1109/iatmsi64286.2025.10985054

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Hiranmaye Sarpana Chandu; Sumeet Mathur; Sandeep Gupta. Artificial Intelligence-Driven Approaches for Automatic Wafer Map Failure Detection in Semiconductor Manufacturing. 2025 IEEE International Conference on Interdisciplinary Approaches in Technology and Management for Social Innovation (IATMSI). 2025-03-06. https://doi.org/10.1109/iatmsi64286.2025.10985054

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