High-Performance Oxide Transistor Induced by a Metal Capping Layer on the Active Layer: Applications in High-speed Measurement
Ji-Min Park; Do Hwan Kim; Hyun-Suk Kim
- Published
- Publisher
- International Display Workshops General Incorporated Association
- Journal / collection
- Proceedings of the International Display Workshops
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.36463/idw.2024.0257
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Cite this source
Ji-Min Park; Do Hwan Kim; Hyun-Suk Kim. High-Performance Oxide Transistor Induced by a Metal Capping Layer on the Active Layer: Applications in High-speed Measurement. Proceedings of the International Display Workshops. 2024-12-04. https://doi.org/10.36463/idw.2024.0257