A Comprehensive Analysis of Unclamped-Inductive-Switching-Induced Electrical Parameter Degradations and Optimizations for 4H-SiC Trench Metal-Oxide-Semiconductor Field-Effect Transistor Structures
Li Liu; Jingqi Guo; Yiheng Shi; Kai Zeng; Gangpeng Li
- Published
- Publisher
- MDPI AG
- Journal / collection
- Micromachines
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.3390/mi15060772
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Cite this source
Li Liu; Jingqi Guo; Yiheng Shi; Kai Zeng; Gangpeng Li. A Comprehensive Analysis of Unclamped-Inductive-Switching-Induced Electrical Parameter Degradations and Optimizations for 4H-SiC Trench Metal-Oxide-Semiconductor Field-Effect Transistor Structures. Micromachines. 2024-06-09. https://doi.org/10.3390/mi15060772