Vegetable Leaf Disease Detection Using Machine Learning
Kapil Kumar Gupta; Harshit Goyal; Namrata Dhanda
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 International Conference on Intelligent and Innovative Technologies in Computing, Electrical and Electronics (IITCEE)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1109/iitcee64140.2025.10915245
The original publisher provides the full text and its access options.
Cite this source
Kapil Kumar Gupta; Harshit Goyal; Namrata Dhanda. Vegetable Leaf Disease Detection Using Machine Learning. 2025 International Conference on Intelligent and Innovative Technologies in Computing, Electrical and Electronics (IITCEE). 2025-01-16. https://doi.org/10.1109/iitcee64140.2025.10915245