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Research literature / Conference paper

A Fast, Statistical, Machine-learning Approach for Automotive Semiconductor Test Reduction

Mehul D. Shroff; Nguyen Nguyen; Kiran Sunny Thota

Published
Publisher
IEEE
Journal / collection
2024 IEEE International Test Conference (ITC)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/itc51657.2024.00032

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Mehul D. Shroff; Nguyen Nguyen; Kiran Sunny Thota. A Fast, Statistical, Machine-learning Approach for Automotive Semiconductor Test Reduction. 2024 IEEE International Test Conference (ITC). 2024-11-03. https://doi.org/10.1109/itc51657.2024.00032

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