Skip to content
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Conference paper

Performance Analysis of Gate-All-Around Transistor at Various Technology Nodes

Vanita Mehta; Sandeep Kumar Arya; Rajiv Sharma

Published
Publisher
IEEE
Journal / collection
2024 International Conference on Integrated Circuits, Communication, and Computing Systems (ICIC3S)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/icic3s61846.2024.10602965

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Vanita Mehta; Sandeep Kumar Arya; Rajiv Sharma. Performance Analysis of Gate-All-Around Transistor at Various Technology Nodes. 2024 International Conference on Integrated Circuits, Communication, and Computing Systems (ICIC3S). 2024-06-08. https://doi.org/10.1109/icic3s61846.2024.10602965

Download RIS