Using the Test Guardband Estimation Method to Forecast Future Semiconductor Yield Trends
Chung-Huang Yeh; Jwu E. Chen
- Published
- Publisher
- Informa UK Limited
- Journal / collection
- IETE Journal of Research
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1080/03772063.2024.2310125
The original publisher provides the full text and its access options.
Cite this source
Chung-Huang Yeh; Jwu E. Chen. Using the Test Guardband Estimation Method to Forecast Future Semiconductor Yield Trends. IETE Journal of Research. 2024-02. https://doi.org/10.1080/03772063.2024.2310125