Advanced Automatic Defect Detection of Semiconductor Chips: Overcoming Complexity and Diversity with Addnet
wei zhao; Yong kang Liu; Yiik Diew Wong; Alex Gu; Xiupeng Shi
- Published
- Publisher
- Elsevier BV
- Research area
- Semiconductors
- Source type
- Preprint / posted paper
- DOI
- 10.2139/ssrn.4944502
This is a preprint or other posted paper. Check the original source for its review and publication status.
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Cite this source
wei zhao; Yong kang Liu; Yiik Diew Wong; Alex Gu; Xiupeng Shi. Advanced Automatic Defect Detection of Semiconductor Chips: Overcoming Complexity and Diversity with Addnet. Elsevier BV. 2024. https://doi.org/10.2139/ssrn.4944502