Concurrent delamination propagation and deformation localization in semiconductor devices
Shawn R. Lavoie; Guodong Nian; Chen-Wei Li; Jason Lan; Yu-Sheng Lin; Yi-Lun Lin; Sherwin Tang; Jyun-Lin Wu; Joost J. Vlassak; Zhigang Suo
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Mechanics of Materials
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.mechmat.2024.105027
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Cite this source
Shawn R. Lavoie; Guodong Nian; Chen-Wei Li; Jason Lan; Yu-Sheng Lin; Yi-Lun Lin; Sherwin Tang; Jyun-Lin Wu; Joost J. Vlassak; Zhigang Suo. Concurrent delamination propagation and deformation localization in semiconductor devices. Mechanics of Materials. 2024-08. https://doi.org/10.1016/j.mechmat.2024.105027