Quantum Metrology Assisted by Machine Learning
Jiahao Huang; Min Zhuang; Jungeng Zhou; Yi Shen; Chaohong Lee
- Published
- Publisher
- Wiley
- Journal / collection
- Advanced Quantum Technologies
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.1002/qute.202300329
The original publisher provides the full text and its access options.
Cite this source
Jiahao Huang; Min Zhuang; Jungeng Zhou; Yi Shen; Chaohong Lee. Quantum Metrology Assisted by Machine Learning. Advanced Quantum Technologies. 2024-01-24. https://doi.org/10.1002/qute.202300329