METHOD FOR TESTING THE RADIATION RESISTANCE OF SEMICONDUCTOR ELECTRONIC MATERIALS IN AN ELECTRON MICROSCOPE
V.A. Kiselevskiy; A.A. Tatarintsev
- Published
- Publisher
- Akademizdatcenter Nauka
- Journal / collection
- Микроэлектроника / Russian Microelectronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.7868/s3034548025050011
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Cite this source
V.A. Kiselevskiy; A.A. Tatarintsev. METHOD FOR TESTING THE RADIATION RESISTANCE OF SEMICONDUCTOR ELECTRONIC MATERIALS IN AN ELECTRON MICROSCOPE. Микроэлектроника / Russian Microelectronics. 2025. https://doi.org/10.7868/s3034548025050011