Using scalable computer vision to automate high-throughput semiconductor characterization
Alexander E. Siemenn; Eunice Aissi; Fang Sheng; Armi Tiihonen; Hamide Kavak; Basita Das; Tonio Buonassisi
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Nature Communications
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1038/s41467-024-48768-2
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Cite this source
Alexander E. Siemenn; Eunice Aissi; Fang Sheng; Armi Tiihonen; Hamide Kavak; Basita Das; Tonio Buonassisi. Using scalable computer vision to automate high-throughput semiconductor characterization. Nature Communications. 2024-06-11. https://doi.org/10.1038/s41467-024-48768-2