Effect of Gate-Electrode/Gate-Dielectric Interlayer on Gate Screening of Remote Phonon Scattering in InGaZnO Thin-Film Transistor with High-k Gate Dielectric
Hao Sun; PuiTo Lai
- Published
- Publisher
- The Electrochemical Society
- Journal / collection
- ECS Meeting Abstracts
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1149/ma2024-02342384mtgabs
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Cite this source
Hao Sun; PuiTo Lai. Effect of Gate-Electrode/Gate-Dielectric Interlayer on Gate Screening of Remote Phonon Scattering in InGaZnO Thin-Film Transistor with High-k Gate Dielectric. ECS Meeting Abstracts. 2024-11-22. https://doi.org/10.1149/ma2024-02342384mtgabs