Application of Residual Neural Network Towards Semiconductor Device Modeling
D. Bavi; S. Khandelwal
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 International Conference on Modeling, Simulation & Intelligent Computing (MoSICom)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1109/mosicom63082.2024.10881030
The original publisher provides the full text and its access options.
Cite this source
D. Bavi; S. Khandelwal. Application of Residual Neural Network Towards Semiconductor Device Modeling. 2024 International Conference on Modeling, Simulation & Intelligent Computing (MoSICom). 2024-12-09. https://doi.org/10.1109/mosicom63082.2024.10881030