An Integrated AI Platform for Accelerating Semiconductor Failure Analysis: Combining Similarity Search, Deep-Learning Image Retrieval, Automated Labeling, and Ontology-Guided Workflow Assistance
Michael Beetz; Clemens Grünewald; Thomas Gänsler; Christian Burmer; Konstantin Schekotihin
- Published
- Publisher
- ASM International
- Journal / collection
- International Symposium for Testing and Failure Analysis
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.31399/asm.cp.istfa2026p0001
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Cite this source
Michael Beetz; Clemens Grünewald; Thomas Gänsler; Christian Burmer; Konstantin Schekotihin. An Integrated AI Platform for Accelerating Semiconductor Failure Analysis: Combining Similarity Search, Deep-Learning Image Retrieval, Automated Labeling, and Ontology-Guided Workflow Assistance. International Symposium for Testing and Failure Analysis. 2026-10-04. https://doi.org/10.31399/asm.cp.istfa2026p0001