Numerial Simulation of a Vacuum Cold Cathode X-Ray Detector Driven by a Dual-Gate Thin Film Transistor
Zhongbin Pu; Zhipeng Zhang; Jiaquan Kong; Juncong She; Shaozhi Deng; Jun Chen
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 37th International Vacuum Nanoelectronics Conference (IVNC)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/ivnc63480.2024.10652463
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Cite this source
Zhongbin Pu; Zhipeng Zhang; Jiaquan Kong; Juncong She; Shaozhi Deng; Jun Chen. Numerial Simulation of a Vacuum Cold Cathode X-Ray Detector Driven by a Dual-Gate Thin Film Transistor. 2024 37th International Vacuum Nanoelectronics Conference (IVNC). 2024-07-15. https://doi.org/10.1109/ivnc63480.2024.10652463