Quality control of lifetime drift in discrete electrical parameters in semiconductor devices via transition modeling
Lukas Sommeregger; Jürgen Pilz
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Microelectronics Reliability
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.microrel.2024.115555
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Cite this source
Lukas Sommeregger; Jürgen Pilz. Quality control of lifetime drift in discrete electrical parameters in semiconductor devices via transition modeling. Microelectronics Reliability. 2025-01. https://doi.org/10.1016/j.microrel.2024.115555