Nano-Tomography Iinvestigation of Residual Damages in p-Type Doped HgCdTe Semiconductor
Clément Lobre; Florian Marmonier; Pierre-Henri Jouneau
- Published
- Publisher
- The Electrochemical Society
- Journal / collection
- ECS Meeting Abstracts
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1149/ma2024-02362530mtgabs
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Cite this source
Clément Lobre; Florian Marmonier; Pierre-Henri Jouneau. Nano-Tomography Iinvestigation of Residual Damages in p-Type Doped HgCdTe Semiconductor. ECS Meeting Abstracts. 2024-11-22. https://doi.org/10.1149/ma2024-02362530mtgabs