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Research literature / Conference paper

Dead-Layer-Free Semiconductor Detectors via Highly Charged Dielectrics

O. Setälä; T. Pasanen; J. Ott; J. Heinonen; V. Vähänissi; H. Savin

Published
Publisher
IEEE
Journal / collection
2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/nss/mic/rtsd57108.2024.10658218

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O. Setälä; T. Pasanen; J. Ott; J. Heinonen; V. Vähänissi; H. Savin. Dead-Layer-Free Semiconductor Detectors via Highly Charged Dielectrics. 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD). 2024-10-26. https://doi.org/10.1109/nss/mic/rtsd57108.2024.10658218

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