Skip to content
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Conference paper

Retracted: Automated Image-Based Defect Detection for Semiconductor Manufacturing

Amit Prakash Sen; Amandeep Gill; Manjula M

Published
Publisher
IEEE
Journal / collection
2024 15th International Conference on Computing Communication and Networking Technologies (ICCCNT)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/icccnt61001.2024.10724695

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Amit Prakash Sen; Amandeep Gill; Manjula M. Retracted: Automated Image-Based Defect Detection for Semiconductor Manufacturing. 2024 15th International Conference on Computing Communication and Networking Technologies (ICCCNT). 2024-06-24. https://doi.org/10.1109/icccnt61001.2024.10724695

Download RIS