A scalable multi-modal attention-based framework for Good-Die-In-Bad-Neighborhood screening in semiconductor manufacturing
Mohammad Ershad Shaik; Abhishek Mishra; Nagarajan Kandasamy; Nur A. Touba
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Microprocessors and Microsystems
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.micpro.2026.105308
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Cite this source
Mohammad Ershad Shaik; Abhishek Mishra; Nagarajan Kandasamy; Nur A. Touba. A scalable multi-modal attention-based framework for Good-Die-In-Bad-Neighborhood screening in semiconductor manufacturing. Microprocessors and Microsystems. 2026-10. https://doi.org/10.1016/j.micpro.2026.105308