TESTING SEMICONDUCTOR PRODUCTS USING LOW-FREQUENCY NOISE PARAMETERS
M. I Gorlov; V. A Sergeev
- Published
- Publisher
- The Russian Academy of Sciences
- Journal / collection
- Дефектоскопия
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.31857/s0130308224060042
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Cite this source
M. I Gorlov; V. A Sergeev. TESTING SEMICONDUCTOR PRODUCTS USING LOW-FREQUENCY NOISE PARAMETERS. Дефектоскопия. 2024-12-15. https://doi.org/10.31857/s0130308224060042