Ion migration in p-type perovskite MAPbI 3 films under an electric field and thin-film transistor device failure
Jiale Su; Zhenxin Yang; Xuanhe Li; Fushun Li; Juntao Hu; Nan Chen; Tao Zhang; Dengke Wang; Zheng-Hong Lu; Qiang Zhu
- Published
- Publisher
- Royal Society of Chemistry (RSC)
- Journal / collection
- Chemical Communications
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1039/d4cc03446e
The original publisher provides the full text and its access options.
Cite this source
Jiale Su; Zhenxin Yang; Xuanhe Li; Fushun Li; Juntao Hu; Nan Chen; Tao Zhang; Dengke Wang; Zheng-Hong Lu; Qiang Zhu. Ion migration in p-type perovskite MAPbI 3 films under an electric field and thin-film transistor device failure. Chemical Communications. 2024. https://doi.org/10.1039/d4cc03446e