ARTIFICIAL INTELLIGENCE IN FUNCTIONAL VERIFICATION: TRANSFORMING SAFETY-CRITICAL SEMICONDUCTOR DESIGN METHODOLOGIES
Yuvaraj J Patil
- Published
- Publisher
- IAEME Publication
- Journal / collection
- INTERNATIONAL JOURNAL OF INFORMATION TECHNOLOGY AND MANAGEMENT INFORMATION SYSTEMS
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.34218/ijitmis_16_02_059
The original publisher provides the full text and its access options.
Cite this source
Yuvaraj J Patil. ARTIFICIAL INTELLIGENCE IN FUNCTIONAL VERIFICATION: TRANSFORMING SAFETY-CRITICAL SEMICONDUCTOR DESIGN METHODOLOGIES. INTERNATIONAL JOURNAL OF INFORMATION TECHNOLOGY AND MANAGEMENT INFORMATION SYSTEMS. 2025-03-12. https://doi.org/10.34218/ijitmis_16_02_059