Machine Learning-Enabled Examination Feedback System
Prashanth Ragam; Botcha Taraka Rutesha Sai; Anshita Priyadarshini Mekatotti; Nallamala Ojasvi; Adigoppula Jahnavi; Pavithra Danaveni
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 3rd IEEE International Conference on Industrial Electronics: Developments & Applications (ICIDeA)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1109/icidea64800.2025.10963164
The original publisher provides the full text and its access options.
Cite this source
Prashanth Ragam; Botcha Taraka Rutesha Sai; Anshita Priyadarshini Mekatotti; Nallamala Ojasvi; Adigoppula Jahnavi; Pavithra Danaveni. Machine Learning-Enabled Examination Feedback System. 2025 3rd IEEE International Conference on Industrial Electronics: Developments & Applications (ICIDeA). 2025-02-21. https://doi.org/10.1109/icidea64800.2025.10963164