Enhancing Semiconductor Nanoprobing Procedures with AI-Driven Tip Detection
David Stefan Kleindiek; Matthias Kemmler; Andreas Zell
- Published
- Publisher
- ASM International
- Journal / collection
- International Symposium for Testing and Failure Analysis
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.31399/asm.cp.istfa2024p0001
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Cite this source
David Stefan Kleindiek; Matthias Kemmler; Andreas Zell. Enhancing Semiconductor Nanoprobing Procedures with AI-Driven Tip Detection. International Symposium for Testing and Failure Analysis. 2024-10-28. https://doi.org/10.31399/asm.cp.istfa2024p0001