Novel electrical characteristic measurement system of semiconductor films for estimating device characteristics
Kook Chul Moon; Hwarim Im; Gyohyeok Yun; Hyoungsik Kim; JungUn Na; Changhwan Kim; Yong-Sang Kim
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Journal of Information Display
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1080/15980316.2024.2417923
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Cite this source
Kook Chul Moon; Hwarim Im; Gyohyeok Yun; Hyoungsik Kim; JungUn Na; Changhwan Kim; Yong-Sang Kim. Novel electrical characteristic measurement system of semiconductor films for estimating device characteristics. Journal of Information Display. 2024-10-23. https://doi.org/10.1080/15980316.2024.2417923