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Intelligent Approach for Analyzing Semiconductor Band Gaps in Nanomaterial Systems

Department of Artificial Intelligence and Data Science, D Y Patil College of Engineering, Akurdi, Pune; Bhagyashree Ashok Tingare; R. A. Kapgate; Department of Mechatronics Engineering, Sanjivani College of Engineering, Kopargaon, MH, India; P. William; Department of Information Technology, Sanjivani College of Engineering, Kopargaon, MH, India; Jaikumar M. Patil; Department of Computer Science and Engineering, Shri Sant Gajanan Maharaj College of Engineering, Shegaon, SGBAU, Amravati; Tarun Dhar Diwan; Controller of Examination (COE), Atal Bihari Vajpayee University, Bilaspur, India; Prasad M. Patare; Department of Mechanical Engineering, Sanjivani College of Engineering, Kopargaon, MH, India; Laxmikant S. Dhamande; Department of Mechanical Engineering, Sanjivani College of Engineering, Kopargaon, MH, India

Published
Publisher
Sumy State University
Journal / collection
Journal of Nano- and Electronic Physics
Research area
Semiconductors
Source type
Journal article
DOI
10.21272/jnep.17(4).04027

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Department of Artificial Intelligence and Data Science, D Y Patil College of Engineering, Akurdi, Pune; Bhagyashree Ashok Tingare; R. A. Kapgate; Department of Mechatronics Engineering, Sanjivani College of Engineering, Kopargaon, MH, India; P. William; Department of Information Technology, Sanjivani College of Engineering, Kopargaon, MH, India; Jaikumar M. Patil; Department of Computer Science and Engineering, Shri Sant Gajanan Maharaj College of Engineering, Shegaon, SGBAU, Amravati; Tarun Dhar Diwan; Controller of Examination (COE), Atal Bihari Vajpayee University, Bilaspur, India; Prasad M. Patare; Department of Mechanical Engineering, Sanjivani College of Engineering, Kopargaon, MH, India; Laxmikant S. Dhamande; Department of Mechanical Engineering, Sanjivani College of Engineering, Kopargaon, MH, India. Intelligent Approach for Analyzing Semiconductor Band Gaps in Nanomaterial Systems. Journal of Nano- and Electronic Physics. 2025. https://doi.org/10.21272/jnep.17(4).04027

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