Performance and reliability of N-type doping-free TFETs: the role of compound semiconductor materials
Bandi Venkata Chandan; Kaushal Kumar Nigam
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Multiscale and Multidisciplinary Modeling, Experiments and Design
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1007/s41939-025-00769-4
The original publisher provides the full text and its access options.
Cite this source
Bandi Venkata Chandan; Kaushal Kumar Nigam. Performance and reliability of N-type doping-free TFETs: the role of compound semiconductor materials. Multiscale and Multidisciplinary Modeling, Experiments and Design. 2025-02-20. https://doi.org/10.1007/s41939-025-00769-4