TMD material investigation for a low hysteresis vdW NCFET logic transistor
I Blessing Meshach Dason; N Kasthuri; D Nirmal
- Published
- Publisher
- IOP Publishing
- Journal / collection
- Semiconductor Science and Technology
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1088/1361-6641/ad2b09
The original publisher provides the full text and its access options.
Cite this source
I Blessing Meshach Dason; N Kasthuri; D Nirmal. TMD material investigation for a low hysteresis vdW NCFET logic transistor. Semiconductor Science and Technology. 2024-02-28. https://doi.org/10.1088/1361-6641/ad2b09