Imaging semiconductor-to-metal transition and topological flat bands of twisted bilayer MoTe2
Shiyong Wang; Yufeng Liu; Yu Gu; Ting Bao; Ning Mao; Can Li; Shudan Jiang; Liang Liu; Dandan Guan; Yaoyi Li; Hao Zheng; Canhua Liu; Kenji Watanabe; Takashi Taniguchi; Wenhui Duan; Jinfeng Jia; Xiaoxue Liu; Yang Zhang; Tingxin Li
- Published
- Publisher
- Springer Science and Business Media LLC
- Research area
- Semiconductors
- Source type
- Preprint / posted paper
- DOI
- 10.21203/rs.3.rs-4650266/v1
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Shiyong Wang; Yufeng Liu; Yu Gu; Ting Bao; Ning Mao; Can Li; Shudan Jiang; Liang Liu; Dandan Guan; Yaoyi Li; Hao Zheng; Canhua Liu; Kenji Watanabe; Takashi Taniguchi; Wenhui Duan; Jinfeng Jia; Xiaoxue Liu; Yang Zhang; Tingxin Li. Imaging semiconductor-to-metal transition and topological flat bands of twisted bilayer MoTe2. Springer Science and Business Media LLC. 2024-07-02. https://doi.org/10.21203/rs.3.rs-4650266/v1