Design of High-Reliability LDO Regulator Incorporated with Additional Parasitic Bipolar Junction Transistor for Low Voltage Applicaiton
U-Yeol Seo; Min-Seo Kim; Jae-Yoon Oh; Yong-Seo Koo
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/icce-asia63397.2024.10773850
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Cite this source
U-Yeol Seo; Min-Seo Kim; Jae-Yoon Oh; Yong-Seo Koo. Design of High-Reliability LDO Regulator Incorporated with Additional Parasitic Bipolar Junction Transistor for Low Voltage Applicaiton. 2024 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia). 2024-11-03. https://doi.org/10.1109/icce-asia63397.2024.10773850