Measuring the Mobility of Charge Carriers in Samples with Low Conductivity by the Field Effect Transistor Method Using Output Characteristics
P. S. Parfenov; Yu. G. Korzhenevskii; A. A. Babaev; A. P. Litvin; A. V. Sokolova; A. V. Fedorov
- Published
- Publisher
- Pleiades Publishing Ltd
- Journal / collection
- Technical Physics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1134/s1063784224040303
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Cite this source
P. S. Parfenov; Yu. G. Korzhenevskii; A. A. Babaev; A. P. Litvin; A. V. Sokolova; A. V. Fedorov. Measuring the Mobility of Charge Carriers in Samples with Low Conductivity by the Field Effect Transistor Method Using Output Characteristics. Technical Physics. 2024-05. https://doi.org/10.1134/s1063784224040303