Comparing the efficacy of logistic regression versus linear regression in predicting semiconductor device health
C. V. S. Kumar; J. S. J. Joselin; N. Chandrasekharan
- Published
- Publisher
- AIP Publishing
- Journal / collection
- AIP Conference Proceedings
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1063/5.0229424
The original publisher provides the full text and its access options.
Cite this source
C. V. S. Kumar; J. S. J. Joselin; N. Chandrasekharan. Comparing the efficacy of logistic regression versus linear regression in predicting semiconductor device health. AIP Conference Proceedings. 2024. https://doi.org/10.1063/5.0229424